General Purpose Electronic Test Equipment Parts

(Page 10) End item NSN parts page 10 of 45
Part Number
NSN
NIIN
164B-G3 Radio Frequency Power Test Set
010391488
165 Interval Timer
005580027
1652-9801 Resistance Bridge
002427349
1658-9700 Impedance Bridge
010636829
1659-9700 Impedance Bridge
010636829
166 Signal Generator
011189976
1663A Electronic Digital Data Analyzer
013870613
1664A-E01 Electronic Digital Data Analyzer
014264440
1689-9016 Rlc Bridge
012219453
1701A012 Oscilloscope
005836578
1707B OPT H15 Oscilloscope
010326914
171 Interval Timer
005580027
1715A Oscilloscope
010562829
17171A Electrical-electron Plug-in Unit
004600185
1722 A/AP-006 Disk Drive Unit
012065809
1722 A/AP-008 Disk Drive Unit
012065809
1722A/AP Disk Drive Unit
012065809
17401A-001 Electrical-electron Plug-in Unit
010686687
1741A Oscilloscope
010580139
1741A-H09 Oscilloscope
010983606
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General Purpose Electronic Test Equipment

Picture of General Purpose Electronic Test Equipment

Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

Practical electronics engineering and assembly requires the use of many different kinds of electronic test equipment ranging from the very simple and inexpensive (such as a test light consisting of just a light bulb and a test lead) to extremely complex and sophisticated such as automatic test equipment (ATE). ATE often includes many of these instruments in real and simulated forms.

Generally, more advanced test gear is necessary when developing circuits and systems than is needed when doing production testing or when troubleshooting existing production units in the field.

The addition of a high-speed switching system to a test system’s configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system’s switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well as the switching hardware form factors available.

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