General Purpose Electronic Test Equipment Parts

(Page 12) End item NSN parts page 12 of 45
Part Number
NSN
NIIN
182T Oscilloscope
010477468
1848288 Oscilloscope
007143992
18500B19A Pulse Generator
004128377
1863 Ohmmeter
000018060
1863-9700 Ohmmeter
000018060
1870A Radio Frequency Power Divider
011089833
1876A Radio Frequency Power Divider
011089833
190-31-1 Semiconductor Device Test Set
008932628
1900A Digital Reado Electronic Counter
010491844
1908 Electrical-electron Plug-in Unit
001067499
1913 Electrical-electron Plug-in Unit
001067500
1950 Oscilloscope
001067497
1980BOPT150-860 Measurement System
012493338
1992 Digital Reado Electronic Counter
012553189
1992-55.04E Digital Reado Electronic Counter
012553189
1992-ETI-04E-55 Digital Reado Electronic Counter
012553189
1A1 Electrical-electron Plug-in Unit
007964851
1A7A Electrical-electron Plug-in Unit
001098267
1TS2PRO-I/AN Network Analyzer
014848826
2-30 Fixed Attenuator
010143463
Page: 12 ...

General Purpose Electronic Test Equipment

Picture of General Purpose Electronic Test Equipment

Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

Practical electronics engineering and assembly requires the use of many different kinds of electronic test equipment ranging from the very simple and inexpensive (such as a test light consisting of just a light bulb and a test lead) to extremely complex and sophisticated such as automatic test equipment (ATE). ATE often includes many of these instruments in real and simulated forms.

Generally, more advanced test gear is necessary when developing circuits and systems than is needed when doing production testing or when troubleshooting existing production units in the field.

The addition of a high-speed switching system to a test system’s configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system’s switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well as the switching hardware form factors available.

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