General Purpose Electronic Test Equipment Parts

(Page 13) End item NSN parts page 13 of 45
Part Number
NSN
NIIN
2-40 Fixed Attenuator
010143464
2-50 Fixed Attenuator
010143465
2001-M Multimeter
014259735
2002B Sweep Generator
012590618
2005R Signal Generator
001901311
2007A Voltmeter
003421714
200B Signal Generator
006785616
200CDR Signal Generator
008065033
20111099 Pulse Generator
010103524
201C Signal Generator
006785616
2020-S4-24 Voltmeter
012503974
2020-S4-24 Voltmeter
012862887
202A Signal Generator
006492032
202CDR Signal Generator
008065033
202H Signal Generator
009836712
203 Multimeter
006248781
203A Multimeter
006248781
203CA00403 Frequency Multiplier
012381986
204C Signal Generator
004893732
205AG Signal Generator
006431568
Page: 13 ...

General Purpose Electronic Test Equipment

Picture of General Purpose Electronic Test Equipment

Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

Practical electronics engineering and assembly requires the use of many different kinds of electronic test equipment ranging from the very simple and inexpensive (such as a test light consisting of just a light bulb and a test lead) to extremely complex and sophisticated such as automatic test equipment (ATE). ATE often includes many of these instruments in real and simulated forms.

Generally, more advanced test gear is necessary when developing circuits and systems than is needed when doing production testing or when troubleshooting existing production units in the field.

The addition of a high-speed switching system to a test system’s configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system’s switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well as the switching hardware form factors available.

Compare Now »
Clear | Hide