General Purpose Electronic Test Equipment Parts

(Page 14) End item NSN parts page 14 of 45
Part Number
NSN
NIIN
209A Signal Generator
001601128
210E Range Calibrator Set
004275157
210S1892 Phasemeter
000018061
211563 Signal Generator
002127365
211A Signal Generator
006488340
211B Square Wave Generator
001072094
212 Oscilloscope
010615519
212A Pulse Generator
005195593
212C Phase Angle Voltmeter
010166151
213 Oscilloscope
010258808
2132090-2 Electrical-electron Plug-in Unit
002708409
2132090-3 Electrical-electron Plug-in Unit
002615139
2132090-4 Electrical-electron Plug-in Unit
002615139
2132091-3 Electrical-electron Plug-in Unit
001857817
2132091-4 Electrical-electron Plug-in Unit
001857817
2135481G1 Oscilloscope
008520179
2144043-1 Electrical-electron Plug-in Unit
003861984
214B-001 Pulse Generator
011407067
214B-H01 Pulse Generator
011663796
2165A-01-K Digi Self-indicating Thermometer
011831442
Page: 14 ...

General Purpose Electronic Test Equipment

Picture of General Purpose Electronic Test Equipment

Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

Practical electronics engineering and assembly requires the use of many different kinds of electronic test equipment ranging from the very simple and inexpensive (such as a test light consisting of just a light bulb and a test lead) to extremely complex and sophisticated such as automatic test equipment (ATE). ATE often includes many of these instruments in real and simulated forms.

Generally, more advanced test gear is necessary when developing circuits and systems than is needed when doing production testing or when troubleshooting existing production units in the field.

The addition of a high-speed switching system to a test system’s configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system’s switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well as the switching hardware form factors available.

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