General Purpose Electronic Test Equipment Parts

(Page 18) End item NSN parts page 18 of 45
Part Number
NSN
NIIN
3056-98 Voltmeter
012863572
3056A-98 Voltmeter
012863572
3056A-MOD 38 Multimeter
011979872
305PA3008 Electrical-electron Plug-in Unit
012493389
3100 Signal Generator
014235540
3100A-4025 Power Supply
012268886
310B Voltmeter
001006847
311U9 Voltmeter
008788648
312B Voltmeter
010121071
317 Oscilloscope
009711236
319525 Voltmeter
010310708
321 Multimeter
011506059
321A Oscilloscope
008520179
321A Voltmeter
010484112
3222-16 Directional Coupler
010817855
323-20-MOD40 Multimeter
010181084
3300A Signal Generator
001186736
3301A Function Ge Plug-in
004662647
3303A Electrical Frequency Meter
012239916
3304A Electrical-electron Plug-in Unit
001042648
Page: 18 ...

General Purpose Electronic Test Equipment

Picture of General Purpose Electronic Test Equipment

Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

Practical electronics engineering and assembly requires the use of many different kinds of electronic test equipment ranging from the very simple and inexpensive (such as a test light consisting of just a light bulb and a test lead) to extremely complex and sophisticated such as automatic test equipment (ATE). ATE often includes many of these instruments in real and simulated forms.

Generally, more advanced test gear is necessary when developing circuits and systems than is needed when doing production testing or when troubleshooting existing production units in the field.

The addition of a high-speed switching system to a test system’s configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system’s switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well as the switching hardware form factors available.

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