General Purpose Electronic Test Equipment Parts

(Page 21) End item NSN parts page 21 of 45
Part Number
NSN
NIIN
3580A Spectrum Analyzer
003591927
3580A-002 Spectrum Analyzer
011706877
3581A Spectrum Analyzer
010127669
3581C Voltmeter
011463558
3586A-003 Telecommun Selective Level Meter
011979972
3586C-H37 Spectrum Analyzer
012253303
3586C-H37-910 Spectrum Analyzer
012253303
3586C/1124A Voltmeter
012264814
3622400 Electrical-electron Plug-in Unit
003615318
3651 Primary Referenc Calibration Set
013763728
3651-1-1 Primary Referenc Calibration Set
013763728
3666-10K-2 Secondary Transf Calibration Set
013874127
3666-10K-3 Secondary Transf Calibration Set
013874127
36A Spectrum Analyzer
006689418
3705A Electrical-electron Plug-in Unit
005205055
3710A Electronic Plug-in Unit Chassis
005204992
3711M Ohmmeter
014943112
3716A Electrical-electron Plug-in Unit
005205059
371BNM Electrical Dummy Load
009703685
371NM Electrical Dummy Load
007849045
Page: 21 ...

General Purpose Electronic Test Equipment

Picture of General Purpose Electronic Test Equipment

Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

Practical electronics engineering and assembly requires the use of many different kinds of electronic test equipment ranging from the very simple and inexpensive (such as a test light consisting of just a light bulb and a test lead) to extremely complex and sophisticated such as automatic test equipment (ATE). ATE often includes many of these instruments in real and simulated forms.

Generally, more advanced test gear is necessary when developing circuits and systems than is needed when doing production testing or when troubleshooting existing production units in the field.

The addition of a high-speed switching system to a test system’s configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system’s switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well as the switching hardware form factors available.

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