General Purpose Electronic Test Equipment Parts

(Page 23) End item NSN parts page 23 of 45
Part Number
NSN
NIIN
400-5164 Voltage Calibrator
002880184
400-5724 Electrical-electron Plug-in Unit
011111074
400-5841 Spectrum Analyzer
008718012
400-6325 Electrical-electron Plug-in Unit
002615139
400-6335 Electrical-electron Plug-in Unit
004780594
400-6336 Electrical-electron Plug-in Unit
009995120
4002A Multimeter
011967893
40081416 Electronic Te Function Generator
010284989
400H Voltmeter
005578261
401-1456 Oscilloscope
009658362
401-1476 Signal Generator
009373525
401-1488 Distortion Analyzer
009363135
401-1508 Electrical-electron Plug-in Unit
010139322
401-4968 Electrical-electron Plug-in Unit
012221577
401-4990 Spectrum Analyzer
012219295
401-9579 Electrical Pulse Analyzer
010814960
401065-1 Voltage Standard
013367029
401321-3254 Multimeter
011506059
401321-S2824 Voltmeter
010484112
4017B Wattmeter
000018063
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General Purpose Electronic Test Equipment

Picture of General Purpose Electronic Test Equipment

Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

Practical electronics engineering and assembly requires the use of many different kinds of electronic test equipment ranging from the very simple and inexpensive (such as a test light consisting of just a light bulb and a test lead) to extremely complex and sophisticated such as automatic test equipment (ATE). ATE often includes many of these instruments in real and simulated forms.

Generally, more advanced test gear is necessary when developing circuits and systems than is needed when doing production testing or when troubleshooting existing production units in the field.

The addition of a high-speed switching system to a test system’s configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system’s switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well as the switching hardware form factors available.

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