General Purpose Electronic Test Equipment Parts

(Page 26) End item NSN parts page 26 of 45
Part Number
NSN
NIIN
413-3570 Electrical-electron Plug-in Unit
009670460
415D Standing Wave Ratio Meter
000668519
415E-E09 Standing Wave Ratio Meter
010446351
415E001 Standing Wave Ratio Meter
010143802
4193A-910 Impedance Meter
012250087
4195A Spectrum Analyzer
013407933
42-8240-106814 Signal Data Recorder
013889493
4204A Signal Generator
001300068
421-0109 Multimeter
010636628
421-0134 Thermistor Mount
010670413
421-0150 Oscilloscope
010580139
421-0306 Spectrum Analyzer
003591927
421-2939 Pulse Generator
010103524
421-2978 Generator
011452808
421-3607 Sweep Generator
011729387
421-6510 Electrical-electron Plug-in Unit
005389809
421-7371 Function Generator
004660586
421-7388 Oscilloscope
009711236
422 Oscilloscope
009203246
4220-S/3 Power Factor Meter
013113742
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General Purpose Electronic Test Equipment

Picture of General Purpose Electronic Test Equipment

Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

Practical electronics engineering and assembly requires the use of many different kinds of electronic test equipment ranging from the very simple and inexpensive (such as a test light consisting of just a light bulb and a test lead) to extremely complex and sophisticated such as automatic test equipment (ATE). ATE often includes many of these instruments in real and simulated forms.

Generally, more advanced test gear is necessary when developing circuits and systems than is needed when doing production testing or when troubleshooting existing production units in the field.

The addition of a high-speed switching system to a test system’s configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system’s switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well as the switching hardware form factors available.

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