General Purpose Electronic Test Equipment Parts

(Page 27) End item NSN parts page 27 of 45
Part Number
NSN
NIIN
4220-S/4 Power Factor Meter
013100802
423-0058 Multimeter
011380394
426-0357 Multimeter
003228715
426-4653 Pulse Generator
005195593
426-4655 Signal Generator
006492032
426-4667 Electrical-electron Plug-in Unit
001186728
426-4674 Sweep Generator
001359866
426-4676 Signal Generator
006495262
426-4678 Signal Generator
006785616
426-4680 Signal Generator
001300068
426-4712 Electronic Marker Generator
004832619
426-4714 Signal Generator
010197890
426-4780 Electrical Frequency Meter
009309687
426-4833 Coordinate Data Recorder
004636042
426-4842 Capacitance-inductance-re Bridge
002361536
426-4903 Digital Reado Electronic Counter
005314752
426-6303 Oscilloscope
009203246
426-6338 Electrical-electron Plug-in Unit
007964851
426-6363 Electrical-electron Plug-in Unit
000512899
4260A Capacitance-inductance-re Bridge
002361536
Page: 27 ...

General Purpose Electronic Test Equipment

Picture of General Purpose Electronic Test Equipment

Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

Practical electronics engineering and assembly requires the use of many different kinds of electronic test equipment ranging from the very simple and inexpensive (such as a test light consisting of just a light bulb and a test lead) to extremely complex and sophisticated such as automatic test equipment (ATE). ATE often includes many of these instruments in real and simulated forms.

Generally, more advanced test gear is necessary when developing circuits and systems than is needed when doing production testing or when troubleshooting existing production units in the field.

The addition of a high-speed switching system to a test system’s configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system’s switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well as the switching hardware form factors available.

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