General Purpose Electronic Test Equipment Parts

(Page 29) End item NSN parts page 29 of 45
Part Number
NSN
NIIN
443-0332 Oscillator Audio
012857240
4452-A Ohmmeter
013537077
45 Voltmeter
008255587
4514-1001 Pulse Generator
010774947
4529-1004 Oscilloscope
010580139
456720000301 Multimeter
013363372
464-04 Oscilloscope
010409211
465B-04 Oscilloscope
011968344
465M Oscilloscope
010326914
466-04 MOD WX Oscilloscope
012684443
466-04-WX Oscilloscope
012684443
466A Radio Frequency Amplifier
009819480
472457 Radio Frequency Test Receiver
011704248
475 Oscilloscope
001270079
475M Oscilloscope
010950292
482943 Direct Current Amplifier
010833801
483C2000 Oscillator Test Set
003392046
491 Spectrum Analyzer
004942937
4912 Voltage Standard
013367029
491C Radio Frequency Amplifier
000841105
Page: 29 ...

General Purpose Electronic Test Equipment

Picture of General Purpose Electronic Test Equipment

Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

Practical electronics engineering and assembly requires the use of many different kinds of electronic test equipment ranging from the very simple and inexpensive (such as a test light consisting of just a light bulb and a test lead) to extremely complex and sophisticated such as automatic test equipment (ATE). ATE often includes many of these instruments in real and simulated forms.

Generally, more advanced test gear is necessary when developing circuits and systems than is needed when doing production testing or when troubleshooting existing production units in the field.

The addition of a high-speed switching system to a test system’s configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system’s switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well as the switching hardware form factors available.

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