General Purpose Electronic Test Equipment Parts

(Page 33) End item NSN parts page 33 of 45
Part Number
NSN
NIIN
5327B Digital Reado Electronic Counter
010188654
5328A-010-020-03O Universal Counter
011952727
5328A-011-021-031-041 Universal Counter
011943908
5328A-021 Digital Reado Electronic Counter
011349995
5328A-C96 Digital Reado Electronic Counter
010390086
5328A-H99 Digital Reado Electronic Counter
011349994
5328AC96 Digital Reado Electronic Counter
010390086
5328AF-H99 Digital Reado Electronic Counter
010390086
5328AF/096 Digital Reado Electronic Counter
010390086
5328B-010-021-03 Digital Reado Electronic Counter
012519861
5334A-010-030 Digital Reado Electronic Counter
012509637
5334B-030-H05-907-910 Electrical Counter
012710224
5334R Digital Reado Electronic Counter
011968119
5340A-001 Digital Reado Electronic Counter
010178582
5340A001 Digital Reado Electronic Counter
010178582
534114-2 Test Probe
004982232
5342/002 Micro Frequency Cou
011425200
5342A-001-002-E03 Digital Reado Electronic Counter
011372180
5342A-002 Digital Reado Electronic Counter
011372180
5342A-002 Micro Frequency Cou
011425200
Page: 33 ...

General Purpose Electronic Test Equipment

Picture of General Purpose Electronic Test Equipment

Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

Practical electronics engineering and assembly requires the use of many different kinds of electronic test equipment ranging from the very simple and inexpensive (such as a test light consisting of just a light bulb and a test lead) to extremely complex and sophisticated such as automatic test equipment (ATE). ATE often includes many of these instruments in real and simulated forms.

Generally, more advanced test gear is necessary when developing circuits and systems than is needed when doing production testing or when troubleshooting existing production units in the field.

The addition of a high-speed switching system to a test system’s configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system’s switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well as the switching hardware form factors available.

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