General Purpose Electronic Test Equipment Parts

(Page 35) End item NSN parts page 35 of 45
Part Number
NSN
NIIN
54504A-E01-910 Oscilloscope
013041743
545A Oscilloscope
007143992
545AP7 Oscilloscope
005836578
54645A-E01 Oscilloscope
014507534
54645N Oscilloscope
014507534
547 Oscilloscope
009313224
54825N Oscilloscope
014518727
5500-2 Synchro Test Set
014763778
5500A Electrical Power Calibrator
014151698
5500A240 Electrical Power Calibrator
014151698
555-21A22A Oscilloscope
008216778
556 Oscilloscope
001334627
562376-4 Time Bas
004102406
562A Radio Frequency Amplifier
009370463
564 Oscilloscope
009658362
564B Oscilloscope
004202379
5700A-03 Voltage Calibrator
012927347
5700A/AN Voltage Calibrator
012927347
5757E-S20 Analyzer Network
012829398
Page: 35 ...

General Purpose Electronic Test Equipment

Picture of General Purpose Electronic Test Equipment

Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

Practical electronics engineering and assembly requires the use of many different kinds of electronic test equipment ranging from the very simple and inexpensive (such as a test light consisting of just a light bulb and a test lead) to extremely complex and sophisticated such as automatic test equipment (ATE). ATE often includes many of these instruments in real and simulated forms.

Generally, more advanced test gear is necessary when developing circuits and systems than is needed when doing production testing or when troubleshooting existing production units in the field.

The addition of a high-speed switching system to a test system’s configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system’s switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well as the switching hardware form factors available.

Compare Now »
Clear | Hide