General Purpose Electronic Test Equipment Parts

(Page 36) End item NSN parts page 36 of 45
Part Number
NSN
NIIN
576 Semiconductor Device Test Set
004389116
577 Curve Tracer Mainframe
010188204
577D2-177 Semiconductor Device Test Set
002023475
577D2MOD177 Semiconductor Device Test Set
002023475
577MOD515E Curve Tracer Mainframe
010188204
5780043 Digital Reado Electronic Counter
000443228
585 Oscilloscope
007970250
585A Oscilloscope
007970250
585B Frequency Calibrator
013584903
58K3279 Multimeter
015217106
5900-0052-18 Oscilloscope
001067497
5L.7433.001.02 Oscilloscope
001270079
600/.01-8 Signal Generator
012649281
600/.01-8 CONF 112 Signal Generator
012649281
600/.01-8-03-06 Signal Generator
012649281
600/.01-8-03-06-19 Signal Generator
012649281
600/10-18CONF158 Signal Generator
012731259
600/6-12 Signal Generator
012509594
6011A Signal Generator
010497760
6011A-01-03-05 Electrical Frequency Synthesizer
012443496
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General Purpose Electronic Test Equipment

Picture of General Purpose Electronic Test Equipment

Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

Practical electronics engineering and assembly requires the use of many different kinds of electronic test equipment ranging from the very simple and inexpensive (such as a test light consisting of just a light bulb and a test lead) to extremely complex and sophisticated such as automatic test equipment (ATE). ATE often includes many of these instruments in real and simulated forms.

Generally, more advanced test gear is necessary when developing circuits and systems than is needed when doing production testing or when troubleshooting existing production units in the field.

The addition of a high-speed switching system to a test system’s configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system’s switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well as the switching hardware form factors available.

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