General Purpose Electronic Test Equipment Parts

(Page 40) End item NSN parts page 40 of 45
Part Number
NSN
NIIN
6872813 Fiber Optic System Tool Kit
014160567
6877804-08 Fiber Optic Cable Assembly
014186285
6877804-8 Fiber Optic Cable Assembly
014186285
6877804-MTJS13 Fiber Optic Cable Assembly
014264484
6877804-MTJS15 Fiber Optic Cable Assembly
014264499
6877804-RMSJS Fiber Optic Cable Assembly
014264489
68778804-8 Fiber Optic Cable Assembly
014186285
694 Electrical Dummy Load
006470587
70039 Measuring Radiation
012445781
70040 Measuring Test Set
012445780
7026283 Fiber Optic Cable Assembly
014315651
7035B Coordinate Data Recorder
004636042
7045B Coordinate Data Recorder
012051291
704A-03 Telephone Test Set
010826396
704A2 Telephone Test Set
010826396
704A2-01 Telecommunication Syste Test Set
013041741
710A Impedance Bridge
005957669
710A Ph Meter
013867150
710B Impedance Bridge
005957669
713232-1 Signal Generator
010624661
Page: 40

General Purpose Electronic Test Equipment

Picture of General Purpose Electronic Test Equipment

Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

Practical electronics engineering and assembly requires the use of many different kinds of electronic test equipment ranging from the very simple and inexpensive (such as a test light consisting of just a light bulb and a test lead) to extremely complex and sophisticated such as automatic test equipment (ATE). ATE often includes many of these instruments in real and simulated forms.

Generally, more advanced test gear is necessary when developing circuits and systems than is needed when doing production testing or when troubleshooting existing production units in the field.

The addition of a high-speed switching system to a test system’s configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system’s switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well as the switching hardware form factors available.

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