General Purpose Electronic Test Equipment Parts

(Page 42) End item NSN parts page 42 of 45
Part Number
NSN
NIIN
774300700 X-y Recorder
012314904
779645 Multimeter
012350428
77AN Multimeter
012139354
780155 Signal Generator
012225007
7904-3 Oscilloscope
010082171
7904453 Variable Attenuator
002154931
7904A-02-03 Oscilloscope Mainframe
013506441
7904OPT3 Oscilloscope
010082171
7907316 Null Meter
007784763
7907413 Variable Attenuator
006022089
7909033 Variable Attenuator
006022089
7910310 Wavemeter
007980712
7910310-2 Wavemeter
004446085
7910329-3 Voltmeter
009969602
7910718-2 Electrical Frequency Meter
009309687
7934-02-03 Oscilloscope
012793446
7A11 Electrical-electron Plug-in Unit
004780596
7A13 Electrical-electron Plug-in Unit
004780594
7A16A Electrical-electron Plug-in Unit
002170418
7A18 Electrical-electron Plug-in Unit
001857817
Page: 42

General Purpose Electronic Test Equipment

Picture of General Purpose Electronic Test Equipment

Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

Practical electronics engineering and assembly requires the use of many different kinds of electronic test equipment ranging from the very simple and inexpensive (such as a test light consisting of just a light bulb and a test lead) to extremely complex and sophisticated such as automatic test equipment (ATE). ATE often includes many of these instruments in real and simulated forms.

Generally, more advanced test gear is necessary when developing circuits and systems than is needed when doing production testing or when troubleshooting existing production units in the field.

The addition of a high-speed switching system to a test system’s configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system’s switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well as the switching hardware form factors available.

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