General Purpose Electronic Test Equipment Parts

(Page 43) End item NSN parts page 43 of 45
Part Number
NSN
NIIN
7A18A Electrical-electron Plug-in Unit
011706084
7A22 Electrical-electron Plug-in Unit
004780597
7A24 Electrical-electron Plug-in Unit
010139322
7A26 Electrical-electron Plug-in Unit
003615318
7B53A Electrical-electron Plug-in Unit
002615139
7B53AN Electrical-electron Plug-in Unit
002708409
7B53AN11 Electrical-electron Plug-in Unit
002708409
7B53ANOPT11 Electrical-electron Plug-in Unit
002708409
7B80 Electrical-electron Plug-in Unit
010324343
7CT1N Electrical-electron Plug-in Unit
005488190
7D01F2 Electrical-electron Plug-in Unit
011202083
7D15 Electrical-electron Plug-in Unit
003922604
7L13 Electrical-electron Plug-in Unit
005389809
7S12 Electrical-electron Plug-in Unit
000041644
7S14 Delayed Swe Sampler
010153710
8000A Multimeter
003228715
8000A/BU Multimeter
010904458
8000A01 Multimeter
002107584
8005B Pulse Generator
010456274
801 Voltmeter
004656991
Page: 43

General Purpose Electronic Test Equipment

Picture of General Purpose Electronic Test Equipment

Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

Practical electronics engineering and assembly requires the use of many different kinds of electronic test equipment ranging from the very simple and inexpensive (such as a test light consisting of just a light bulb and a test lead) to extremely complex and sophisticated such as automatic test equipment (ATE). ATE often includes many of these instruments in real and simulated forms.

Generally, more advanced test gear is necessary when developing circuits and systems than is needed when doing production testing or when troubleshooting existing production units in the field.

The addition of a high-speed switching system to a test system’s configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system’s switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well as the switching hardware form factors available.

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