General Purpose Electronic Test Equipment Parts

(Page 44) End item NSN parts page 44 of 45
Part Number
NSN
NIIN
8010M-01 Multimeter
011216977
8013B Pulse Generator
010103524
8018A Generator
011452808
8020A Multimeter
010636628
803B Voltmeter
009724046
803BAF Voltmeter
009030407
803BAG Voltmeter
009892497
8050A-01 Test Set
011142598
806301-1 Electrical Pulse Analyzer
004244370
80K-40-5 Test Lead
010165991
8114A Pulse Generator
011407067
8116 OPT 001 Pulse-sweep Generator
012262793
8116A-001 Pulse-sweep Generator
012262793
8116AOPT001 Pulse-sweep Generator
012262793
815AF Impedance Bridge
005957669
815AFA Impedance Bridge
005957669
8160A Pulse Generator
010774947
8201 Electrical Dummy Load
009946797
8210-01 Modulation Meter
012848256
8210-01-S3 Modulation Meter
012848256
Page: 44

General Purpose Electronic Test Equipment

Picture of General Purpose Electronic Test Equipment

Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

Practical electronics engineering and assembly requires the use of many different kinds of electronic test equipment ranging from the very simple and inexpensive (such as a test light consisting of just a light bulb and a test lead) to extremely complex and sophisticated such as automatic test equipment (ATE). ATE often includes many of these instruments in real and simulated forms.

Generally, more advanced test gear is necessary when developing circuits and systems than is needed when doing production testing or when troubleshooting existing production units in the field.

The addition of a high-speed switching system to a test system’s configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system’s switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well as the switching hardware form factors available.

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