5961-01-411-1833

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Model or part number: T507084054AB

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About this product
Nickel plated finish

Description

Diode Bridge NSN 5961-01-411-1833.

NSN 5961-01-411-1833 Datasheet

MRC:
--
NIIN:
014111833
MRC:
--
NATO Stock Number:
5961-01-411-1833
MRC:
--
Shelf Life:
N/A
MRC:
--
UOM:
--
MRC:
--
DEMIL:
No
FIIG:
--
FIIG:
A503H0
MRC:
--
INC:
00300
MRC:
--
IMM:
TX
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All Products Certified

Factory New, New Material, New Surplus, Overhauled, Serviceable, Repairable, and AS Removed / Used material will be accompanied by a Certificate of Conformance, and any other documents/trace when applicable. We have a 7 year record retention.

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Quality | ISO 9001:2015 + AS9120B

We are committed to quality and follow an AS9120 quality management system. AeroBase Group is HAZMAT certified and registered with DDTC, ITAR, and Aviation Suppliers Association (ASA). All products are 100% inspected.

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Shipping

Delivery of IN-STOCK orders ship same-day when order is placed before 2:00 PM EST.

Delivery dates for NON-STOCK items are estimates based on current backlog and are subject to confirmation at the time of order.

Import / Export

Schedule B Classification
Schedule B Number
NAIC National Association of Insurance Commissioners
End Use A classification system for U.S. exported and imported merchandise based on principal use rather than the physical characteristics of the merchandise. End-Use codes are assigned by the Bureau of Economic Analysis under the U.S. Department of Commerce.
SITC Commodity classification system defined by the United Nations.
USDA
HITECH
Schedule B:
8541900000
NAICS:
334413
End Use Class:
21320
SITC:
77688
USDA:
1
HITECH:
5

Schedule B Codes Definitions:

Schedule B 8541900000

Diode, Transistor & Similar Semiconductor Device Parts

End Use Code 21320

Semiconductors

Standard Intl. Trade Class (SITC) 77688

Parts Of Diodes, Transistors and Similar Semiconductor Devices (including Photosensitive), Light Emitting Diodes and Mounted Piezoelectric Crystals

Manufacturers

This NSN is registered to the following cage codes.
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