Part Number 4010-01

Semiconductor Device Test Set

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Part Number
DEMIL
Shelf Life
UOM
NIIN
Part:
4010-01
Demil:
No
Shelf Life:
UOM:
NIIN:
014332218

Part Information
Open circuit voltage rise rate 200 v/s, 1000 v/s; output voltage 1000v; usable measuring range 10-1000 volts; test current for solid state protectors 1 ma at 10 pct; measurement accuracy .5 pct; 3 nema 5024 lithium batteries; storage temp m10 to 60 degrees c; operating temp 0 to 50 degrees c

NSN
National Stock Number:
6625-01-433-2218 6625014332218
TXT
Description:
Semiconductor Device Test Set
INC
INC
Item Name Code:
25006
MRC:
The national stock number or the identification information of the end equipment for which the item is a part.AGAV
End Application:
Milstar af terminal remoting syst m (maftrs)
MRC:
The relationship of the electrical power source to the item.AKWC
Electrical Power Source Relationship:
Operating
MRC:
An indication of whether or not a facility/ies/ to accommodate a battery/ies/ is included.ALSF
Internal Battery Accommodation:
Included
MRC:
An indication of the feature/s/ of the inclosure.ANPZ
Inclosure Feature:
Single item w/housing
MRC:
Indicates the type of test for which the item is designed.AQXY
Test Type For Which Designed:
Zener diodes testing in high altitude electromagnetic pulse (hemp) filters in milstar af terminal remoting system
MRC:
Describes the capabilities,intended use,and/or purpose for which the item is provided.FTLD
Functional Description:
Uses a linear volt ramp generator, a low voltage capacitive discharge, current limit element, 1 mamp current detection & control circuit, & peak read metering system
MRC:
Characteristics or qualities of an item,not covered in any other requirement,which are considered essential information for one or more functions excluding nsn assignment.SUPP
Supplementary Features:
Used in conjunction with rockwell built hemp filter test set; josyln calls this a surge protector test set

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