Part Number 99-0376

Semiconductor Device Test Set

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Part Number
DEMIL
Shelf Life
UOM
NIIN
Part:
99-0376
Demil:
No
Shelf Life:
UOM:
NIIN:
015355582

Part Information
Access automated probing station

NSN
National Stock Number:
6625-01-535-5582 6625015355582
TXT
Description:
Semiconductor Device Test Set
INC
INC
Item Name Code:
25006
MRC:
The value,or range of values,of root mean square potential for which the item is rated.ACYN
Ac Voltage Rating:
115.0 volts and 230.0 volts
MRC:
The number of complete cyclic changes,per unit of time,for which an item is rated.ACZB
Frequency Rating:
Between 50.0 hertz and 60.0 hertz
MRC:
The relationship of the electrical power source to the item.AKWC
Electrical Power Source Relationship:
Operating
MRC:
Indicates the type of test for which the item is designed.AQXY
Test Type For Which Designed:
Automated test probe for printed circuit cards
MRC:
The number of alternating current phases.FAAZ
Phase:
Single
MRC:
Those unusual or unique characteristics or qualities of an item not covered in the other requirements and which are determined to be essential for identification.FEAT
Special Features:
Max probing area: 15.3" x 12.9"; maximum component height: 2.375"; computer interfaces: rs232 and pci bus

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