Part Number
DEMIL
Shelf Life
UOM
NIIN
NSN
National Stock Number:
TXT
Description:
Diode Semiconductor Device
MRC:
The element,compound,or mixture of which the inclosure is fabricated,excluding any surface treatment.ABBH
Inclosure Material:
Plastic
MRC:
The dimension measured along the longitudinal axis with terminated points at the extreme ends of the item.ABHP
Overall Length:
0.680 inches
MRC:
A measurement of the longest straight line across a circular cross-sectional plane.ADAV
Overall Diameter:
Between 0.370 inches and 0.400 inches
MRC:
The means of attaching the item.AXGY
Mounting Method:
Terminal
MRC:
Those features,not otherwise specified,which may be required for proper functioning of the item.CBBL
Features Provided:
Hermetically sealed case
MRC:
The chemical compound or mechanical mixture properties of which the semiconductor is fabricated.CTMZ
Semiconductor Material:
Silicon
MRC:
The value of the voltage that may be applied,expressed in volts,and the symbol used to identify the specific electrical characteristic.CTQN
Voltage Rating In Volts Per Characteristic:
480.0 source supply voltage
MRC:
The level of electrical flow and the symbol used to identify the specific electrical characteristic.CTQX
Current Rating Per Characteristic:
0.25 amperes forward current, average absolute
MRC:
The maximum temperature at which the item is designed to operate at each measurement point.CTSG
Maximum Operating Tempurature Per Measurement Point:
150.0 degrees celsius ambient air
MRC:
Test conditions and ratings,or environmental and performance requirements that are different,more critical,or more specific than those specified in a governing test data document.SPCL
Special Test Features:
Navord od41152
MRC:
Indicates the type and number of terminals for providing electrical connection.TTQY
Terminal Type And Quantity:
2 uninsulated wire lead
MRC:
A feature of the item of supply which must be specifically recorded when the reference number covers a range of items.ZZZY
Reference Number Differentiating Characteristics:
As differentiated by special test features
