General Purpose Electronic Test Equipment Parts

(Page 16) End item NSN parts page 16 of 45
Part Number
NSN
NIIN
2465B-09-10 Oscilloscope
012738156
2465B-11-MODWB Oscilloscope
012738156
2465OPT010 Oscilloscope
012493357
247000 Ohmmeter
011253471
247000-47 Ohmmeter
011253471
253 Impedance Bridge
011253775
260 Oscillograph
001857801
260A Q-meter
006686200
260AFP1 Multimeter
010391491
261 Current-voltage Standard
003072850
2654A-BCST Semiconductor Device Assembly
014148582
269-3 Multimeter
004332402
27-AN Multimeter
012348248
2754P MOD NS Spectrum Analyzer
012862917
277D Standing Wave Ratio Meter
012820576
27II/AN Multimeter
012348248
284-2216 Multimeter
013122930
28480-5340A001 Digital Reado Electronic Counter
011225602
2901 Electronic Marker Generator
004832619
2921042-004 Time Bas
004102406
Page: 16 ...

General Purpose Electronic Test Equipment

Picture of General Purpose Electronic Test Equipment

Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

Practical electronics engineering and assembly requires the use of many different kinds of electronic test equipment ranging from the very simple and inexpensive (such as a test light consisting of just a light bulb and a test lead) to extremely complex and sophisticated such as automatic test equipment (ATE). ATE often includes many of these instruments in real and simulated forms.

Generally, more advanced test gear is necessary when developing circuits and systems than is needed when doing production testing or when troubleshooting existing production units in the field.

The addition of a high-speed switching system to a test system’s configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system’s switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well as the switching hardware form factors available.

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