General Purpose Electronic Test Equipment Parts

(Page 22) End item NSN parts page 22 of 45
Part Number
NSN
NIIN
3730A Electronic Plug-in Unit Chassis
005204991
3750 Variable Electronic Filter
000012376
3750A Variable Attenuator
000479555
3789B Electronic System Test Set Group
013119110
3951-100 Directional Coupler
013131548
3A74 Electrical-electron Plug-in Unit
000512899
3F4325-117 Wavemeter
006431498
3T77A Electrical-electron Plug-in Unit
008550877
400-4524 Modulation Meter
010937831
400-4655 Electrical-electron Plug-in Unit
001857817
400-4676 Calibration Generator
011917651
400-4690 Electrical-electron Plug-in Unit
003615318
400-4692 Electrical-electron Plug-in Unit
010324343
400-4697 Special Scale Meter
010799347
400-4699 Signal Generator Modulator
000893146
400-4700 Electronic Te Function Generator
011078152
400-4966 Power Amplifier
010686762
400-4970 Signal Generator
011350002
400-5087 Electrical-electron Plug-in Unit
001098267
400-5132 Spectrum Analyzer
009584473
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General Purpose Electronic Test Equipment

Picture of General Purpose Electronic Test Equipment

Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

Practical electronics engineering and assembly requires the use of many different kinds of electronic test equipment ranging from the very simple and inexpensive (such as a test light consisting of just a light bulb and a test lead) to extremely complex and sophisticated such as automatic test equipment (ATE). ATE often includes many of these instruments in real and simulated forms.

Generally, more advanced test gear is necessary when developing circuits and systems than is needed when doing production testing or when troubleshooting existing production units in the field.

The addition of a high-speed switching system to a test system’s configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system’s switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well as the switching hardware form factors available.

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