5962-01-490-0043

Memory Microcircuit email this page
ITAR Registered

Model or part number: 9826040-4

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Description

Memory Upgrade NSN 5962-01-490-0043.

pdf NSN 5962-01-490-0043 Datasheet

MRC:
Those features,not otherwise specified,which may be required for proper functioning of the item.CBBL
Features Provided:
Electrostatic sensitive
MRC:
The chemical compound or mechanical mixture properties of which the inclosure is fabricated.CQSJ
Inclosure Material:
Ceramic
MRC:
Indicates the physical configuration of the inclosure.CQSZ
Inclosure Configuration:
Dual-in-line
MRC:
An indication of the basic electronic circuit elements assembled to output a logic function.CQWX
Output Logic Form:
Complementary-metal oxide-semiconductor logic and transistor-transistor logic
MRC:
The arrangement or pattern which describes the input circuitry of the item.CQZP
Input Circuit Pattern:
2 input and 3 input and 9 input
MRC:
The master requirement codes of those requirements which are technically critical by reason of tolerance,fit,performance,or other characteristics which affect identification of the item.CRTL
Criticality Code Justification:
Cbbl
MRC:
The metallic,nonmetallic,and/or chemical properties with which the item is plated,dipped,and/or coated. the treatment is designed to protect the terminal surface(s) and cannot be wiped off.CWSG
Terminal Surface Treatment:
Solder
MRC:
The name assigned to the item by the government agency or commercial organization controlling the design of the item.CXCY
Product Name:
Microcircuit, programmed
MRC:
The value of the voltage applied and type of specific electrical characteristic for which the item is designed.CZEN
Voltage Rating And Type Per Characteristic:
5.0 volts power source
MRC:
Indicates the type of memory device used on the item.CZER
Memory Device Type:
Eprom
MRC:
Indicates the type and number of terminals for providing electrical connection.TTQY
Terminal Type And Quantity:
28 printed circuit
MRC:
--
NIIN:
014900043
MRC:
--
NATO Stock Number:
5962-01-490-0043
MRC:
--
Shelf Life:
N/A
MRC:
--
UOM:
--
MRC:
--
DEMIL:
FIIG:
--
FIIG:
A458A0
MRC:
--
INC:
41015
MRC:
--
IMM:
TX
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Factory New, New Material, New Surplus, Overhauled, Serviceable, Repairable, and AS Removed / Used material will be accompanied by a Certificate of Conformance, and any other documents/trace when applicable. We have a 7 year record retention.

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Quality | ISO 9001:2015 + AS9120B

We are committed to quality and follow an AS9120 quality management system. AeroBase Group is HAZMAT certified and registered with DDTC, ITAR, and Aviation Suppliers Association (ASA). All products are 100% inspected.

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Shipping

Delivery of IN-STOCK orders ship same-day when order is placed before 2:00 PM EST.

Delivery dates for NON-STOCK items are estimates based on current backlog and are subject to confirmation at the time of order.

Formal Definition

Government issue definition of NSN 5962-01-490-0043

A circuit designed to store information and/or coded instructions for later use. Item has pins or other connections to install in a computer or computing device. does not include magnetic drums, tapes, punched cards or the like. for items that have portable type connections see memory, portable, solid state.

Import / Export

Schedule B Classification
Schedule B Number
NAIC National Association of Insurance Commissioners
End Use A classification system for U.S. exported and imported merchandise based on principal use rather than the physical characteristics of the merchandise. End-Use codes are assigned by the Bureau of Economic Analysis under the U.S. Department of Commerce.
SITC Commodity classification system defined by the United Nations.
USDA
HITECH
Schedule B:
8542900000
NAICS:
334413
End Use Class:
21320
SITC:
77689
USDA:
1
HITECH:
5

Schedule B Codes Definitions:

Schedule B 8542900000

Electronic Integrated Circuits and Microassembly Parts

End Use Code 21320

Semiconductors

Standard Intl. Trade Class (SITC) 77689

Parts Of Electronic Integrated Circuits and Microassembles

Manufacturers

This NSN is registered to the following cage codes.
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